X-Ray Diffraction

X-ray diffraction is the definitive technique for determining the crystal structure, phase composition, and crystallographic properties of materials. Malvern Panalytical's XRD portfolio spans benchtop to floor-standing systems, serving applications from academic research and pharmaceutical development to industrial quality control and process optimisation across mining, cement, and advanced materials industries.

Our diffractometers combine cutting-edge X-ray optics with advanced detector technology and intuitive software to deliver exceptional data quality with minimal operator expertise. The Aeris compact diffractometer brings research-grade XRD performance to any laboratory environment, while the Empyrean multi-purpose platform offers unparalleled versatility for the most demanding crystallographic studies.

Beyond traditional phase identification and quantification, our XRD solutions support advanced applications including residual stress measurement, texture analysis, thin film characterisation, small-angle X-ray scattering, and pair distribution function analysis. Our HighScore analysis software provides comprehensive tools for phase identification using the world's largest reference database, Rietveld refinement for quantitative phase analysis, and automated batch processing for high-throughput environments. Our dedicated application scientists support customers worldwide with method development and training.

Our X-Ray Diffraction Solutions

• Powder X-Ray Diffraction — Phase identification, quantification, and structural analysis of polycrystalline materials using Bragg-Brentano and transmission geometry
• Benchtop XRD (Aeris) — Compact, research-grade diffractometer for quality control and routine phase analysis in any laboratory
• Multi-Purpose XRD (Empyrean) — Configurable platform supporting powder, thin film, SAXS, PDF, and micro-diffraction experiments
• Residual Stress Analysis — Non-destructive measurement of residual stresses in metals, ceramics, and composite materials
• Thin Film Analysis — Characterisation of layer thickness, density, roughness, and crystallographic orientation
• Small-Angle X-Ray Scattering (SAXS) — Nanostructure characterisation of polymers, proteins, and porous materials
• HighScore Analysis Software — Industry-leading software for phase identification, Rietveld refinement, and crystallographic analysis
• In-Situ and Non-Ambient XRD — Real-time diffraction studies under controlled temperature, humidity, and atmosphere conditions